The Journal of Industry and Technology

Industrial Analytical Instrumentation

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Renishaw's inVia confocal Raman microscope
connects to Bruker's Dimension Icon AFM

Renishaw is an experienced supplier of integrated Raman-AFM solutions, having offered them for over 16 years. The latest addition to the range of instruments it supports is Bruker's Dimension Icon AFM. This additional pairing demonstrates the extreme flexibility of the Renishaw inVia confocal microscope, and its ability to interface to a wide range of instruments employing many analytical techniques.

inVia-Icon is a fully integrated Raman-AFM system. It has a comprehensive range of features, making it the highest performing, yet easy-to-use, system for co-localised Raman-AFM measurements. It supports a full range of AFM techniques and µ-Raman capabilities, and can characterise the properties of materials at sub-micrometre and nanometre scales.

The Dimension Icon provides users with uncompromised performance, robustness, and the flexibility to perform nearly every AFM measurement type, at resolutions previously only obtained by extensively customized systems. The inVia microscope complements this by producing both rich, detailed, chemical images and highly specific Raman data from discrete points. Users can make both Raman and AFM measurements without moving their samples between instruments and without compromising performance. In addition, if necessary, both instruments can be used independently.

The inVia-Icon combination has a flexible arm linking the two instruments; this couples light between the two with mirrors, providing a higher efficiency than fibre optic coupling. This ensures users can acquire high quality data in the minimum time, with market-leading signal-to-noise levels.

The flexible coupling arm employs Renishaw's StreamLineHR™ high resolution mapping technology. It can Raman map areas up to 500 µm x 500 µm, with position encoders ensuring 100 µm repeatability. Bruker's proprietary PeakForce QNM complements StreamLineHR by providing even higher resolution nano-mechanical information.

"Renishaw's patented sampling arm allows the sample to be measured while it is still mounted on the AFM; making correlated measurements with both systems is easy," said Tim Batten, Renishaw Applications Scientist. He added, "The arm does not contact the AFM and, as such, does not affect its performance."

Adding inVia's powerful chemical imaging capabilities to the Bruker Dimension Icon sets a new standard, delivering high-performance surface characterisation with both efficiency and ease. For an up-to-date listing of the AFM/SPM models that can be coupled with an inVia, contact your local Renishaw office.

Renishaw in profile

Renishaw is a world leader in metrology and spectroscopy technologies, with a strong history of innovation in product development and manufacturing.

Since its formation in 1973, Renishaw has supplied companies small and large, worldwide, with innovative products that increase process productivity, improve product quality, and deliver cost-effective automation solutions.

A high level of investment in research and development (R&D) has resulted in developments across a wide range of other product areas, including neurosurgical robots, dental scanners and additive manufacturing systems. Historically total annual expenditure on R&D, including related engineering costs, has amounted to between 14% and 18% of turnover.

With more than 70 operations in 32 countries, and over 3,600 employees, Renishaw's customers are strongly supported throughout the world with outstanding technical expertise and service.

For further information, view website: www.renishaw.com/raman and www.renishaw.com/contacts or e-mail: david.reece@renishaw.com
   Refer to page 707

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